[20p-A304-1~12] 2.2 Detection systems

[20p-A304-10] Development of an ultra-high-resolution multi-probe CdTe SPECT imager: Concept

〇Shinichiro Takeda¹, Tadashi Orita¹, Fumiki Moriyama¹, Hirotaka Sugawara¹, Ryota Tomaru^2,3, Miho Katsuragawa^2,3, Goro Yabu^2,3, Shin Watanabe^2,3, Tadayuki Takahashi^2,3, Riyo Zochi⁴, Hiroshi Mizuma⁴, Yosuke Kanayama⁴ (1.OIST, 2.ISAS, 3.U. Tokyo, 4.RIKEN)

Keywords:semiconductor, CdTe, SPECT