The 65h JSAP Spring Meeting, 2018

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3 Optics and Photonics » 3.8 Optical measurement, instrumentation, and sensor

[20p-C303-1~11] 3.8 Optical measurement, instrumentation, and sensor

Tue. Mar 20, 2018 1:45 PM - 4:45 PM C303 (52-303)

Toshihiro Somekawa(Inst. for Laser Tech.), Yasunori Saito(Shinshu Univ.)

2:00 PM - 2:15 PM

[20p-C303-2] Two-dimensional birefringence profiler with a wide observation field
using polarization diffractive gratings

〇(M2)Takuma Ogawa1, Takashi Fukuda2, Akira Emoto1 (1.Doshisha Univ., 2.AIST)

Keywords:Birefringence

The optical phenomenon called birefringence is an unfamiliar word, but in fact it is closely related to our daily life. We have been developing "birefringence profiler" which images the two-dimensional birefringence distribution utilizing the principle of birefringence-light intensity conversion owing to certain diffraction gratings exhibiting special polarization dependences. Among these, we found that the optical system with a wider field of view could be realized.