The 65h JSAP Spring Meeting, 2018

Presentation information

Oral presentation

3 Optics and Photonics » 3.8 Optical measurement, instrumentation, and sensor

[20p-C303-1~11] 3.8 Optical measurement, instrumentation, and sensor

Tue. Mar 20, 2018 1:45 PM - 4:45 PM C303 (52-303)

Toshihiro Somekawa(Inst. for Laser Tech.), Yasunori Saito(Shinshu Univ.)

2:30 PM - 2:45 PM

[20p-C303-4] Precise measurement of refractive index distribution by dual-comb spectroscopy

〇(M1)Yue Wang1,2, Akifumi Asahara1,2, Ken-ichi Kondo1,2, Kaoru Minoshima1,2 (1.University of Electro-Communications, 2.JST, ERATO MINOSHIMA Intelligent Optical Synthesizer)

Keywords:dual comb, spectroscopy, refractive index

Dual-comb spectroscopy enable precise and high rapid spectral detection in a wide frequency range, because of its great characteristic as a scanner in an interferometric spectrometer. We have applied this method to solid physical property evaluation and have established a novel measurement method for precisely evaluating the complex refractive index and thickness of solid sample. In this research, we aimed to realize a measurement system that can precisely and simultaneously evaluate the refractive index and thickness distribution of a solid sample by multiplying dual-comb spectrometry which was one-point measurement.