2:30 PM - 2:45 PM [19p-E310-5] A study of distribution of residual stress on n type GaN in contact with the Au/Ti/Cr film electrode by micro-Raman imaging in high temperatures 〇Jun Suda1, Motoki Kawase1, Sousuke Imai1, Ryoga Fuji1 (1.Chukyo Univ.)