Taiho Yoshinaka

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Speaker, Author, Co-Author

Thu. Sep 19, 2019 9:30 AM - 11:45 AM E311 (E311)

Oral presentation
| 6 Thin Films and Surfaces
| 6.3 Oxide electronics

[19a-E311-1~8] 6.3 Oxide electronics

10:15 AM - 10:30 AM

[19a-E311-4] PDA effect on analog behavior of HfO₂ charge trap memory

〇Taiho Yoshinaka¹, Hisato Onishi¹, Yasuo Nara¹ (1.Univ. of Hyogo)