Shohei Rokuno

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Speaker, Author, Co-Author

Wed. Sep 18, 2019 1:00 PM - 6:00 PM N302 (N302)

Oral presentation
| 13 Semiconductors
| 13.7 Compound and power electron devices and process technology

[18p-N302-1~18] 13.7 Compound and power electron devices and process technology

2:45 PM - 3:00 PM

[18p-N302-7] Measurement accuracy of net acceptor concentration of p-type GaN by C-V method

〇(M1)Shohei Rokuno¹, Horita Masahiro^1,2, Jun Suda^1,2 (1.Nagoya Univ., 2.Nagoya Univ. IMaSS)