Kei Onodera

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Speaker, Author, Co-Author

Thu. Sep 19, 2019 1:30 PM - 3:30 PM PB4 (PB)

Poster presentation
| 15 Crystal Engineering
| 15.6 Group IV Compound Semiconductors (SiC)

[19p-PB4-1~8] 15.6 Group IV Compound Semiconductors (SiC)

1:30 PM - 3:30 PM

[19p-PB4-3] Detection of Defect Levels in 4H-SiC FET by Below-Gap Excitation Light

〇Kei Onodera¹, Norihiko Kamata¹, Yasuto Hijikata¹, Akinori Takeyama², Takeshi Oshima², Toru Yoshie³ (1.Saitama Univ., 2.QST, 3.Sanken Electric)