[18a-E303-1~12] 13.1 Fundamental properties, surface and interface, and simulations of Si related materials

[18a-E303-12] Evaluation of Complex Dielectric Function of Si-based Materials from Energy Loss Signals for Photoelectrons

〇Akio Ohta¹, Noriyuki Taoka¹, Mitsuhisa Ikeda¹, Katsunori Makihara¹, Seiichi Miyazaki¹ (1.Nagoya Univ.)

Keywords:Photoemission Study, Dielectric Function