[18a-E303-1~12] 13.1 Fundamental properties, surface and interface, and simulations of Si related materials

[18a-E303-9] Accuracy improvement of Non-Destructive Surface States Density Measurement by Pulse Photoconductivity Method

〇Takuma Yamashita¹, Narumi Abe¹, Yuki Kumagae¹, Hiroki Obana¹, Ryo Ogasawara², Tatsuki Hamada², Ryo Yoshii², Hiroshi Kubota¹, Takeshi Hashishin¹, Masao Yoshioka² (1.GSST Kumamoto Univ, 2.Kumamoto Univ)

Keywords:Pulse Photoconductivity Method