The 80th JSAP Autumn Meeting 2019

Presentation information

Oral presentation

13 Semiconductors » 13.1 Fundamental properties, surface and interface, and simulations of Si related materials

[18a-E303-1~12] 13.1 Fundamental properties, surface and interface, and simulations of Si related materials

Wed. Sep 18, 2019 9:00 AM - 12:15 PM E303 (E303)

Koichiro Saga(Sony), Takashi Hasunuma(Univ. of Tsukuba)

11:15 AM - 11:30 AM

[18a-E303-9] Accuracy improvement of Non-Destructive Surface States Density Measurement by Pulse Photoconductivity Method

Takuma Yamashita1, Narumi Abe1, Yuki Kumagae1, Hiroki Obana1, Ryo Ogasawara2, Tatsuki Hamada2, Ryo Yoshii2, Hiroshi Kubota1, Takeshi Hashishin1, Masao Yoshioka2 (1.GSST Kumamoto Univ, 2.Kumamoto Univ)

Keywords:Pulse Photoconductivity Method