[18a-E318-1~14] 【CS.7】 Code-sharing Session of 7.2 & 7.4 & 9.5

[18a-E318-1] Residue reduction method by repairing defects of interference fringes in electron hologram

〇Katsuyoshi Miura¹, Yoshihiro Midoh¹, Yasukazu Murakami², Koji Nakamae¹ (1.IST, Osaka Univ., 2.Eng., Kyushu Univ.)

Keywords:electron hologram, residue, phase reconstruction

This report shows the results of evaluation and examination of the effect aiming at the practical use of the residue reduction method by repairing the fringe defect in the electron hologram. Pseudo defects are introduced in the hologram generated by simulation. The effectiveness of this method is evaluated changing parameters such as size of defect repair area. The size of the defect repair area is optimal when the area is as small as possible covering the entire defect.