2019年第80回応用物理学会秋季学術講演会

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コードシェアセッション » 【CS.7】 7.2 電子ビーム応用、7.4 量子ビーム界面構造計測、9.5 新機能材料・新物性のコードシェアセッション

[18a-E318-1~14] 【CS.7】 7.2 電子ビーム応用、7.4 量子ビーム界面構造計測、9.5 新機能材料・新物性のコードシェアセッション

2019年9月18日(水) 09:00 〜 12:45 E318 (E318)

橘田 晃宜(産総研)、川久保 貴史(香川高専)

10:15 〜 10:30

[18a-E318-6] In-situ Scanning Electron Microscopy Observation of Lead Dendrites
Grown in an Electrochemical Cell

〇(D)Gada He1、Yoshifumi Oshima1、Masahiko Tomitori1 (1.JAIST)

キーワード:Scanning Electron Microscopy, Electrochemical Cell, Electro-plating and Stripping

We developed an electrochemical cell for in-situ scanning electron microscopy (SEM) using an in-lens FE-SEM setup (S-5200, Hitachi Hightechnologies), having two electrode terminals to observe the processes of electro-plating and stripping of lead dendrites simultaneously with measuring the cyclic voltammetry. Pb dendrites on an Au electrode in an electrolyte of 1.5 M Pb(NO3)2 solution were grown and decomposed during a cyclic of voltammogram. The in-situ SEM observation revealed the initial formation of Pb islands and the subsequent Pb dendritic growth. The electrolyte concentration and the scan rate of applied voltage changed the dendrites formation and decomposition. The correlation of concentration site and local structural differences will be discussed.