The 80th JSAP Autumn Meeting 2019

Presentation information

Oral presentation

6 Thin Films and Surfaces » 6.3 Oxide electronics

[18p-E311-1~18] 6.3 Oxide electronics

Wed. Sep 18, 2019 1:15 PM - 6:00 PM E311 (E311)

Jobu Matsuno(Osaka Univ.), Azusa Hattori(Osaka Univ.)

4:15 PM - 4:30 PM

[18p-E311-12] Impact of scaling down the VO2 Mott transistor below material correlation length

Takeaki Yajima1,2, Yusuke Samata1, Tomonori Nishimura1, Takahisa Tanaka1, Ken Uchida1, Akira Toriumi1 (1.Univ. of Tokyo, 2.JST PRESTO)

Keywords:metal-insulator transition, inhomogeneity, steep slope

An ideal Mott transistor would show a sharp ON/OFF switching due to the metal-insulator transition in the channel material. In practice, however, the switching becomes gradual due to the inhomogeneous transition which is inherent to the metal-insulator transition. In this study, the VO2-channel Mott transistor is scaled down to the inhomogeneous length scale of the metal-insulator transition, and the ultra-sharp switching is obtained by electrostatic gating.