The 80th JSAP Autumn Meeting 2019

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Symposium (Oral)

Symposium (technical) » New development of surface and interface evaluation methods for thin films

[19a-B31-1~5] New development of surface and interface evaluation methods for thin films

Thu. Sep 19, 2019 9:00 AM - 11:45 AM B31 (B31)

Yoshinobu Nakamura(Univ. of Tokyo), Tomoki Abe(Tottori Univ.)

10:00 AM - 10:45 AM

[19a-B31-3] Interface Properties and Electronic Device Applications of Oxide Heterostructures

〇Akihito Sawa1, Hiroyuki Yamada1 (1.AIST)

Keywords:Oxides, Interface, Device applications

We will talk about the relationship between interface properties and structures of oxide heterostructures and device characteristics of interface-engineered ferroelectric tunnel junctions.