[19a-E318-1~12] 【CS.7】 Code-sharing Session of 7.2 & 7.4 & 9.5

[19a-E318-12] XANAM imaging of surface structures on Ge sample surfaces

〇Shushi Suzuki¹, Shingo Mukai², Wang Jae Chun³, Masaharu Nomura⁴, Syuntarou Fujimori¹, Mitsuhisa Ikeda¹, Katsunori Makihara¹, Seiichi Miyazaki¹, Kiyotaka Asakura² (1.Nagoya Univ., 2.Hokkaido Univ., 3.ICU, 4.KEK-PF)

Keywords:Synchrotron Radiation X-ray, noncontact atomic force microscopy, Germanium

We have developed an X-ray aided noncontact atomic force microscope (XANAM) that combines NC-AFM and synchrotron radiation X-rays to study chemical analysis of sample surfaces at the nanoscale. We previously reported that a change in force signals could be induced around the Ge-K X-ray absorption edge energy on a Ge sample surface under X-ray irradiation. In this report, force volume measurements as an expansion to imaging were performed on a surface of Ge single crystal and Ge quantum dots as samples. Besides, some instrumental improvements were made.