The 80th JSAP Autumn Meeting 2019

Presentation information

Symposium (Oral)

Symposium (technical) » Advanced ion microscopy? Application for future nano scale materials and devices

[19p-E302-1~8] Advanced ion microscopy? Application for future nano scale materials and devices

Thu. Sep 19, 2019 1:30 PM - 5:30 PM E302 (E302)

Shu Nakaharai(NIMS), Reo Kometani(Univ. of Tokyo), Hiroshi Mizuta(JAIST), Shinichi Ogawa(AIST)

5:00 PM - 5:30 PM

[19p-E302-8] Multi-species FIB for high resolution and large area nanofabrication applications

Andrew Yu1 (1.Raith Asia)

Keywords:FIB, Nanofabrication