The 80th JSAP Autumn Meeting 2019

Presentation information

Oral presentation

3 Optics and Photonics » 3.8 Optical measurement, instrumentation, and sensor

[20a-E205-1~12] 3.8 Optical measurement, instrumentation, and sensor

Fri. Sep 20, 2019 9:00 AM - 12:15 PM E205 (E205)

Tatsutoshi Shioda(Saitama Univ.), Toshihiro Somekawa(Inst. for Laser Tech.)

12:00 PM - 12:15 PM

[20a-E205-12] Study on nonlinear processes in a waveguide device for ultrabroadband comb generation using optical frequency metrology

Kazumichi Yoshii1,2, Junia Nomura1,2, Kaho Taguchi1, Yusuke Hisai1,2, Feng-Lei Hong1,2 (1.Dep. Phys. YNU, 2.JST, ERATO MINOSHIMA IOS)

Keywords:nonlinear optics, waveguide type device, metrology

Nonlinear devices based on waveguides are essential for highly efficient nonlinear optical conversion. However, the nonlinearity associated with the optical conversion in such devices is not self-evident. We introduce a new method using optical frequency metrology to reveal the nonlinearity inside a waveguide, and determined that the spectral broadening in a periodically poled lithium niobate waveguide is due to the quadratic nonlinearity. We also demonstrated an absolute frequency measurement using the generated ultra-broadband comb as an example of the practical application. This study will contribute to the design of chip-scale and fully-integrated devices for efficient nonlinear optical conversion.