The 80th JSAP Autumn Meeting 2019

Presentation information

Oral presentation

13 Semiconductors » 13.8 Optical properties and light-emitting devices

[20a-E302-1~13] 13.8 Optical properties and light-emitting devices

Fri. Sep 20, 2019 9:00 AM - 12:15 PM E302 (E302)

Ariyuki Kato(Nagaoka Univ. of Tech.)

12:00 PM - 12:15 PM

[20a-E302-13] Study on the precious measurement of the real part of the third-order nonlinear susceptibility tensor in InP thick film using Z-scan technique with elliptical polarization

Kinya Ohara1, Soma Nishibe1, Toshio Matsusue1, Hiroyuki Bando1 (1.Chiba Univ.)

Keywords:Z-scan, two-photon absorption, nonlinear refractivity