3:45 PM - 4:00 PM
[20p-C213-10] Design and error-rate testing of an area-reduced SFQ-NOT gate
Keywords:single flux quantum, error rate
Oral presentation
11 Superconductivity » 11.5 Junction and circuit fabrication process, digital applications
Fri. Sep 20, 2019 1:15 PM - 5:00 PM C213 (C213)
Yoshinao Mizugaki(UEC), Yuki Yamanashi(Yokohama Natl. Univ.)
3:45 PM - 4:00 PM
Keywords:single flux quantum, error rate