1:30 PM - 3:30 PM
[20p-PB2-18] Characterization of thick film structure by back-incidence neutron reflectometry II
Keywords:neutron reflectivity
Presentation information
Poster presentation
7 Beam Technology and Nanofabrication » 7 Beam Technology and Nanofabrication (Poster)
[20p-PB2-1~18] 7 Beam Technology and Nanofabrication (Poster)
Fri. Sep 20, 2019 1:30 PM - 3:30 PM PB2 (PB)