[21a-B12-1~8] 16.3 Bulk, thin-film and other silicon-based solar cells

[21a-B12-7] Characteristic PID phenomena related to ARC film and conduction type of wafer for crystalline silicon photovoltaic modules

〇Sachiko Jonai^1,2, Kyotaro Nakamura³, Yasuaki Ishikawa¹, Yukiharu Uraoka¹, Atsushi Masuda² (1.NAIST, 2.AIST, 3.Toyota Technol. Inst.)

Keywords:potential-induced degradation, anti-reflective coating