1:30 PM - 1:45 PM
[21p-E310-4] Infuluence of InGaN underlying layer on device characteristics of AlGaN/GaN HEMT
Keywords:HMET, AlGaN/GaN, underlying layer
Oral presentation
15 Crystal Engineering » 15.4 III-V-group nitride crystals
Sat. Sep 21, 2019 12:45 PM - 4:00 PM E310 (E310)
Atsushi Kobayashi(Univ. of Tokyo), Koichi Naniwae(USHIO OPTO SEMICONDUCTORS, INC.)
1:30 PM - 1:45 PM
Keywords:HMET, AlGaN/GaN, underlying layer