4:00 PM - 6:00 PM [9p-PB6-14] Long-duration potential-induced degradation tests for n-type rear-emitter crystalline Si photovoltaic modules 〇Yuansong Xu1, Seira Yamaguchi1, Atsushi Masuda2, Keisuke Ohdaira1 (1.JAIST, 2.AIST)