Katsuyuki Ochiai

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Speaker, Author, Co-Author

Sun. Mar 10, 2019 1:45 PM - 6:15 PM W641 (W641)

Oral presentation
| 6 Thin Films and Surfaces
| 6.3 Oxide electronics

[10p-W641-1~17] 6.3 Oxide electronics

5:15 PM - 5:30 PM

△ [10p-W641-14] The effect of contacting a device area with a measurement probe on resistive switching characteristics

〇Katsuyuki Ochiai^1,2, Kentaro Kinoshita¹, Takumi Kaneko¹, Mutsunori Uenuma³, Yukiharu Uraoka³ (1.Tokyo Univ. of science, 2.Tottori Univ., 3.NAIST)