Yoichiro Ishikawa

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Speaker, Author, Co-Author

Tue. Mar 12, 2019 1:30 PM - 5:00 PM M111 (H111)

Oral presentation
| 15 Crystal Engineering
| 15.7 Crystal characterization, impurities and crystal defects

[12p-M111-1~13] 15.7 Crystal characterization, impurities and crystal defects

3:15 PM - 3:30 PM

△ [12p-M111-8] Error Factors in Carbon Quantitative Analysis in Si Using Room-Temperature Photoluminescence after Electron Irradiation

〇Yoichiro Ishikawa¹, Michio Tajima¹, Ryutaro Matsuoka¹, Atsushi Ogura¹ (1.Meiji Univ.)