Takuya Murooka

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Speaker, Author, Co-Author

Mon. Mar 11, 2019 9:00 AM - 11:45 AM M113 (H113)

Oral presentation
| 6 Thin Films and Surfaces
| 6.2 Carbon-based thin films

[11a-M113-1~11] 6.2 Carbon-based thin films

9:15 AM - 9:30 AM

△ [11a-M113-2] Characterization of Leakage Current in Diamond pn⁺ Junction Using EBIC Technique

〇Takuya Murooka¹, Toshiharu Makino², Masahiko Ogura², Hiromitsu Kato², Satoshi Yamasaki², Takayuki Iwasakai¹, Julien Pernot³, Mutsuko Hatano¹ (1.Tokyo Tech., 2.AIST, 3.Inst. NEEL/CNRS)