Eiichi Murakami

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Speaker, Author, Co-Author

Sun. Mar 10, 2019 9:00 AM - 12:00 PM 70A (70th Anniversary Auditorium)

Oral presentation
| 15 Crystal Engineering
| 15.6 Group IV Compound Semiconductors (SiC)

[10a-70A-1~11] 15.6 Group IV Compound Semiconductors (SiC)

11:15 AM - 11:30 AM

[10a-70A-9] Reliability enhancement effects of SiC-MOSFETs under gate-switching operation

Rei Fukunaga¹, Kenzo Saito¹, Koji Shinmachi¹, Yuki Inoue¹, Naoki Oogushi¹, 〇Eiichi Murakami¹ (1.Kyushu Sangyo Univ.)

11:30 AM - 11:45 AM

[10a-70A-10] Temperature dependent (-60-200 ℃) drain current model of SiC-MOSFETs

Mitsuaki Suzuki¹, Yohei Takahashi¹, 〇Eiichi Murakami¹ (1.Kyushu Sangyo Univ.)