Naruhide Kato

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Speaker, Author, Co-Author

Sun. Mar 10, 2019 9:00 AM - 11:45 AM W641 (W641)

Oral presentation
| 6 Thin Films and Surfaces
| 6.3 Oxide electronics

[10a-W641-1~10] 6.3 Oxide electronics

9:15 AM - 9:30 AM

[10a-W641-2] Investigation of degradation mechanism and influence of post processes around NiO/ZnO heterointerface

〇Naruhide Kato¹, Kohei Takeuchi¹, Wang Zehua¹, Ryo Tanuma¹, Mutsumi Sugiyama^1,2 (1.Tokyo Univ. of Sci., 2.RIST)