Taiho Yoshinaka

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Speaker, Author, Co-Author

Sun. Mar 10, 2019 9:00 AM - 11:45 AM W641 (W641)

Oral presentation
| 6 Thin Films and Surfaces
| 6.3 Oxide electronics

[10a-W641-1~10] 6.3 Oxide electronics

9:30 AM - 9:45 AM

[10a-W641-3] PDA condition dependency on analog behavior of HfO₂ charge trap memory

〇Taiho Yoshinaka¹, Shota Enomoto¹, Masahiro Hatamoto¹, Yasuo Nara¹ (1.Univ. of Hyogo)