Satoshi Hasegawa

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Speaker, Author, Co-Author

Sun. Mar 10, 2019 1:30 PM - 6:15 PM M114 (H114)

Symposium (Oral)
| Symposium
| Progress of characterization and monitoring techniques that reveal fundamental of light process

[10p-M114-1~12] Progress of characterization and monitoring techniques that reveal fundamental of light process

4:30 PM - 4:45 PM

[10p-M114-7] In-process measurement of processed hole depth under femtosecond laser processing using optical coherence tomography with swept light source

〇Satoshi Hasegawa¹, Masatoshi Fujimoto², Yoshio Hayasaki¹ (1.Utsunomiya Univ., 2.Hamamatsu Photonics)