Taiki Akiyama

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Speaker, Author, Co-Author

Sun. Mar 10, 2019 4:00 PM - 6:00 PM PB4 (PB)

Poster presentation
| 3 Optics and Photonics
| 3.13 Semiconductor optical devices

[10p-PB4-1~23] 3.13 Semiconductor optical devices

4:00 PM - 6:00 PM

[10p-PB4-13] Optical constant measurement of the porous silicon using imaging ellipsometry

〇Taiki Akiyama¹, Yuki Iizuka¹, Lianhua Jin¹, Eiichi Kondoh¹, Bernard Gelloz² (1.Yamanashi Univ, 2.Nagoya Univ)