2:15 PM - 2:30 PM
[10p-S423-4] Measurement of InP / InGaAs interfacial strain distribution by STEM Moire fringe method
〇Tongmin Chen1, Yoshifumi Oshima1, Masashi Akabori1 (1.JAIST)
Sun. Mar 10, 2019 1:30 PM - 5:15 PM S423 (S423)
2:15 PM - 2:30 PM
〇Tongmin Chen1, Yoshifumi Oshima1, Masashi Akabori1 (1.JAIST)