Tengo Maruyama

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Speaker, Author, Co-Author

Mon. Mar 11, 2019 9:00 AM - 11:45 AM W933 (W933)

Oral presentation
| 6 Thin Films and Surfaces
| 6.6 Probe Microscopy

[11a-W933-1~11] 6.6 Probe Microscopy

11:00 AM - 11:15 AM

[11a-W933-9] Measurement of sample surface resistance by non-contact atomic force microscopy

〇Tengo Maruyama¹, Kohei Oida¹, Daiki Kura¹, Masahiko Tomitori², Toyoko Arai¹ (1.Kanazawa Univ., 2.JAIST)