The 66th JSAP Spring Meeting, 2019

Presentation information

Poster presentation

3 Optics and Photonics » 3.8 Optical measurement, instrumentation, and sensor

[10a-PA2-1~11] 3.8 Optical measurement, instrumentation, and sensor

Sun. Mar 10, 2019 9:30 AM - 11:30 AM PA2 (PA)

9:30 AM - 11:30 AM

[10a-PA2-5] Low-coherence Tomography Applied to Tomographic Refractive Index Measurement

〇(M1)Yutaro Karasawa1, Syohei Gunji1, Tatsutoshi Shioda1 (1.Saitama Univ.)

Keywords:Low-coherence Tomography, Refractive Index Measurement

We have already shown that the electric field spectroscopy based on the optical tomography by low coherence interference can distinguish each interface signal from the tomographic image of the acquired multilayer sample. It can be realized by applying Fourier and Hilbert transform for the analysis algorithm of the tomographic signals. In this presentation, it is shown that the refractive index spectrum of each layer of the multilayer sample is obtained without measuring the geometric thickness of the sample separately. At this time, the control system of the experimental setup including the supercontinuum light source, which outputs the visible light region, was improved.