11:00 AM - 11:15 AM
[10a-W521-8] Evaluation of electrical properties of graphene/SiC interface by conductive-AFM measurement
Keywords:Schottky junction
We have measured that the interface electrical property changes from Schottky to ohmic condction by intertion of graphene layers into the metal/n-type SiC interface which is revealed by conductive AFM measuremts. This result indicate that the electron affinity of the n-type SiC was modulated by interaction between the graphene and the n-type SiC.