The 66th JSAP Spring Meeting, 2019

Presentation information

Oral presentation

13 Semiconductors » 13.1 Fundamental properties, surface and interface, and simulations of Si related materials

[10a-W934-1~11] 13.1 Fundamental properties, surface and interface, and simulations of Si related materials

Sun. Mar 10, 2019 9:00 AM - 12:00 PM W934 (W934)

Koichiro Saga(Sony), Takashi Hasunuma(Univ. of Tsukuba)

9:15 AM - 9:30 AM

[10a-W934-2] Oxidation-induced shrink of Si-Si bond

ShuJun YE1, Kikuo YAMABE1, Tetsuo ENDOH1 (1.Tohoku Univ.)

Keywords:Vertical MOSFET, Si nanoplillar, Oxidation