[10p-M112-1~7] 7.1 X-ray technologies

[10p-M112-2] Verification of STED phenomenon in Ce: LSO

〇Takeo Ejima¹, Natsumi Shinozaki², Misaki Shoji², Takayuki Ishiyama³, Genta Hatayama¹, Kazuyuki Sakaue⁴, Toshitaka Wakayama³, Takeshi Higashiguchi² (1.IMRAM, Tohoku Univ., 2.Utsunomiya Univ., 3.Saitama Med. Univ., 4.UT-PSC)

Keywords:Soft X-ray imaging device, scintillators, STED

In our group we have used scintillators as a detector for the soft X-ray microscope. In order to increase the resolution of the detector, we are applying the STED method to the scintillator of our detector. The scintillator, Ce:LSO, shows high quantum efficiency in soft X-ray region, and has not been known to show the STED phenomenon. In the presentation, we report the confirmation details of the STED phenomenon in Ce:LSO.