The 66th JSAP Spring Meeting, 2019

Presentation information

Poster presentation

17 Nanocarbon Technology » 17 Nanocarbon Technology (Poster)

[10p-PB5-1~55] 17 Nanocarbon Technology (Poster)

Sun. Mar 10, 2019 4:00 PM - 6:00 PM PB5 (PB)

4:00 PM - 6:00 PM

[10p-PB5-4] Analysis of individual single-wall carbon nanotubes with dual-wavelength photothermal microscopy

〇(M1)Yuya Ishikawa1, Jun Miyazaki1 (1.Wakayama Univ.)

Keywords:Photothermal microscopy, carbon nanotubes

Single-wall carbon nanotubes (SWCNTs ) are heterogeneous samples containing mixtures of metallic and semiconducting species with a variety of lengths and defects. Single particle measurement and analysis are thus crucial for eliminating the heterogeneity and inhomogeneity of bulk SWCNTs. In this study, we measured individual SWCNTs with dual-wavelength photothermal microscopy and identified metallic and semiconducting SWCNTs by means of spectral unmixing. Photothermal microscopy can visualize the distribution of chromophore and we confirmed that both SWCNT species are detected with high sensitivity. Furthermore, simultaneous dual color imaging at the wavelength of 520 and 640 nm and spectral unmixing analysis were conducted to identify metallic and semiconducting SWCNTs.