[10p-W611-1~14] 16.3 Bulk, thin-film and other silicon-based solar cells

[10p-W611-11] Reduction of near-interconnector degradation under pressure cooker test for crystalline silicon PV module by tabbing with conduction film

〇Yuji Ino¹, Shuichi Asao¹, Katsuhiko Shirasawa¹, Hidetaka Takato¹ (1.AIST)

Keywords:Crystalline silicon solar cell, Accelerated test, Interconnector

At the previous JSAP meeting, we reported the degradation of crystalline Si PV modules by the Pressure Cooker Test (PCT), which is one of accelerated aging tests in a high temperature and high humidity environment, observed that the degradation spread near the interconnector (we call “near-IC degradation”) and investigated the effects of tabbing condition of interconnector on the degradation. In this study, we investigate the modules which are tabbed with a conductive film (CF) by PCT and discuss the mechanism of the near-IC degradation.