The effect of contacting a device area with a measurement probe on resistive switching characteristics

Presentation information

Oral presentation

6 Thin Films and Surfaces » 6.3 Oxide electronics

Sun. Mar 10, 2019 1:45 PM - 6:15 PM W641 (W641)

Kentaro Kinoshita(Tokyo Univ. of Sci.), Yusuke Nishi(Kyoto Univ.)

5:15 PM - 5:30 PM

〇Katsuyuki Ochiai^1,2, Kentaro Kinoshita¹, Takumi Kaneko¹, Mutsunori Uenuma³, Yukiharu Uraoka³ (1.Tokyo Univ. of science, 2.Tottori Univ., 3.NAIST)

Keywords:ReRAM, SrTiO3, perovskite