[11a-PB1-1~3] 13.1 Fundamental properties, surface and interface, and simulations of Si related materials

[11a-PB1-1] Characterization of Electron Field Emission from Multiply-Stacked Si-QDs/SiO₂ Structures

〇Tatsuya Takemoto¹, Yuto Futamura¹, Katsunori Makihara¹, Akio Ohta¹, Mitsuhisa Ikeda¹, Seiishi Miyazaki¹ (1.Nagoya Univ.)

Keywords:Si QDs, electron emission