The 66th JSAP Spring Meeting, 2019

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12 Organic Molecules and Bioelectronics » 12.4 Organic light-emitting devices and organic transistors

[11a-S222-1~12] 12.4 Organic light-emitting devices and organic transistors

Mon. Mar 11, 2019 9:00 AM - 12:15 PM S222 (S222)

Toshinori Matsushima(Kyushu Univ.), Yoshiyuki Suzuri(Yamagata Univ.)

12:00 PM - 12:15 PM

▲ [11a-S222-12] Twofold enhancement in reliability of organic light emitting diodes with thermally-induced morphological change of organic layer

〇(D)Duy Cong Le1, Li Yining1, Heisuke Sakai1, Hideyuki Murata1 (1.Japan Advanced Inst. of Science and Technology)

Keywords:reliability, annealing, molecular orientation

The reliability enhancement because of annealing of organic light emitting diodes (OLEDs) fabricated under high vacuum condition (10-6~10-7 Torr) can be as a result of the morphological change of organic layers and/or the removal of residual water from the deposited material after annealing.1-2) Recently, we achieved the lower region of ultra-high vacuum (UHV) condition (10-10~10-11 Torr) with extremely low concentration of residual water by utilizing non-evaporable getter pumps (NEGPs) and regular turbo molecular pumps (TMPs) in OLED deposition chamber.3) In this report, we demonstrate twofold enhancement in reliability of OLED can be achieved by the thermally-induced morphological change of organic layers.