XRD measurements of GaAs nanowires with N and Bi

Presentation information

Oral presentation

15 Crystal Engineering » 15.3 III-V-group epitaxial crystals, Fundamentals of epitaxy

Mon. Mar 11, 2019 9:30 AM - 12:15 PM S422 (S422)

Kwoen Jinkwan(The Univ. of Tokyo), Keisuke YAMANE(Toyohashi Inst. of Tech.)

9:30 AM - 9:45 AM

〇Takaya Mita¹, Ryo Fujiwara¹, Mitsuki Yukimune¹, Fumitaro Isikawa¹ (1.Ehime Univ)

Keywords:XRD measurements