[11a-W933-1~11] 6.6 Probe Microscopy

[11a-W933-1] Measurement time reduction in scanning thermal noise microscopy

〇Hiroshi Tono¹, Kei Kobayashi¹, Kuniko Kimura¹, Hirohumi Yamada¹ (1.Kyoto Univ.)

Keywords:subsurface structure, AFM

Scanning thermal noise microscopy (STNM) is a technique to visualize the subsurface structure from the thermal noise spectrum of the cantilever in the contact state. Since it has no influence of the spurious of the excitation mechanism, it is effective for elucidating the mechanism of visualization of subsurface structure. However, the measurement time is so long that there are problems such as the influence of thermal drift and change of cantilever contact pressure with time. In this research, we attempted to reduce the measurement time of STNM by optimizing measurement parameters, and we report the results.