The 66th JSAP Spring Meeting, 2019

Presentation information

Oral presentation

6 Thin Films and Surfaces » 6.2 Carbon-based thin films

[11p-M113-1~20] 6.2 Carbon-based thin films

Mon. Mar 11, 2019 1:15 PM - 7:00 PM M113 (H113)

Kazuhiro Oyama(DENSO), Shinobu Onoda(QST), Fujii Satoshi(N.I.T, Okinawa coll.)

2:15 PM - 2:30 PM

[11p-M113-4] High frequency performance evaluation of (111) diamond MOSFETs for complementary RF power amplifiers application

〇(B)Ken Kudara1, Shoichiro Imanishi1, Nobutaka Oi1, Satoshi Okubo1, Kiyotaka Horikawa1, Taisuke Kageura1, Atsushi Hiraiwa1, Hiroshi Kawarada1,2 (1.Waseda Univ., 2.Waseda Zaiken)

Keywords:Radio frequency Field Effect Transistor, Complementary RF power amplifiers, Diamond

2DHG diamond is expected to be applied as a high-frequency and high-power p-FET. Complementary FETs are optimal for class-D high power radio frequency amplifiers, and diamond p-FET is the only p-FET which constructs a complementary circuit for GaN n-FET. GaN n-FET can be formed on (111) diamond substrate by heteroepitaxial growth. If a p-FET with similar performance could be fabricated on the same substrate, a monolithic complimentary high frequency amplifier can be realized. In this work, we fabricated 2DHG diamond MOSFETs with high quality Al2O3 layers acting as gate insulator on (111) diamond substrate and evaluated radio frequency characteristics at high voltage operation (|VDS| ≥ 30 V).