The 66th JSAP Spring Meeting, 2019

Presentation information

Oral presentation

1 Interdisciplinary Physics and Related Areas of Science and Technology » 1.5 Instrumentation, measurement and Metrology

[11p-M116-1~15] 1.5 Instrumentation, measurement and Metrology

Mon. Mar 11, 2019 1:15 PM - 5:00 PM M116 (H116)

Nao Terasaki(AIST), Abe Hisashi (AIST), Minami Amano(AIST)

4:45 PM - 5:00 PM

[11p-M116-15] Study of an inspection system for defects in walls using terahertz 3D imaging

Homare Momiyama1,2,3, Yoshiaki Sasaki2, Isao Yoshimine2, Shigenori Nagano1, Tetsuya Yuasa3, Chiko Otani2 (1.TOPCON, 2.RIKEN RAP, 3.Yamagata Univ.)

Keywords:3D imaging, nondestructive inspection

We constructed two types of three-dimensional imaging systems using a terahertz wave source for the inspection of defects in infrastructures and evaluated its performance: a swept source optical coherence tomography (SS-OCT) system, and a phase-shifting interferometry (PSI) system. Experiments showed the depth resolutions of SS-OCT and PSI were 68 mm and 3 µm, respectively. In addition, we imaged voids behind a tile using the SS-OCT system to demonstrate the effectiveness of the inspection application.