The 66th JSAP Spring Meeting, 2019

Presentation information

Poster presentation

15 Crystal Engineering » 15.3 III-V-group epitaxial crystals, Fundamentals of epitaxy

[11p-PA4-1~13] 15.3 III-V-group epitaxial crystals, Fundamentals of epitaxy

Mon. Mar 11, 2019 1:30 PM - 3:30 PM PA4 (PA)

1:30 PM - 3:30 PM

[11p-PA4-9] Correlation between the surface morphology and diffusion lengths of Ga adatom in GaP growth by MBE

〇(DC)Jose Alberto Piedra1, Keisuke Yamane1, Koki Shota1, Hiroto Sekiguchi1, Hiroshi Okada1, Akihiro Wakahara1 (1.Toyohashi Univ. of Tech.)

Keywords:Surface Morphology, Gallium Phosphide, semiconductor

In this work Ga adatom incorporation diffusion length was quantified in two different directions, <110> and <1-10>, during MBE growth of GaP layer. Using Atomic Force Microscopy we observed the formation of islands in the surface for different growth conditions. By measuring the length of the islands in the two different directions, a correlation between the diffusion length and the length of the islands was discovered.