1:30 PM - 3:30 PM
▲ [11p-PA4-9] Correlation between the surface morphology and diffusion lengths of Ga adatom in GaP growth by MBE
Keywords:Surface Morphology, Gallium Phosphide, semiconductor
In this work Ga adatom incorporation diffusion length was quantified in two different directions, <110> and <1-10>, during MBE growth of GaP layer. Using Atomic Force Microscopy we observed the formation of islands in the surface for different growth conditions. By measuring the length of the islands in the two different directions, a correlation between the diffusion length and the length of the islands was discovered.