The 66th JSAP Spring Meeting, 2019

Presentation information

Poster presentation

15 Crystal Engineering » 15.7 Crystal characterization, impurities and crystal defects

[11p-PA6-1~7] 15.7 Crystal characterization, impurities and crystal defects

Mon. Mar 11, 2019 1:30 PM - 3:30 PM PA6 (PA)

1:30 PM - 3:30 PM

[11p-PA6-1] First principles analysis on stability and diffusion barrier of metal atoms near the Si (001) surface

〇(M1)Noriyuki Nonoda1, Koji Sueoka2 (1.Graduate School of Okayama Pref. Univ., 2.Okayama Pref. Univ.)

Keywords:Si wafer, metal, First principles analysis