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[12a-M121-4] Normally-Off β-Ga2O3 MOSFET with Nitrogen-Doped Channel
Keywords:Gallium oxide (Ga2O3), Power device
Since β-Ga2O3 has a large band gap of 4.5 eV and a high dielectric breakdown electric field of 5 MV/cm or more, it attracts attention as a future power device semiconductor material. So far, we have realized a vertical normally-on MOSFET in which a current blocking layer was formed by ion implantation doping of nitrogen (N) functioning as a deep acceptor in β-Ga2O3. Here we report the fabrication and its characteristics of a lateral normally-off β-Ga2O3 MOSFET using N-doped Ga2O3 channel.